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Proceedings Papers

Reversible Permeabilization of Plasma Membranes With Engineered Nano-Scale Switchable Pores

Michael J. Russo, Hagan Bayley, Mehmet Toner
Proc. ASME. IMECE96, Advances in Heat and Mass Transfer in Biotechnology, 43-45, November 17–22, 1996
Paper No: IMECE1996-0749
https://doi.org/10.1115/IMECE1996-0749
View Paper titled, Reversible Permeabilization of Plasma Membranes With Engineered Nano-Scale Switchable Pores
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Topics: Cell membranes, Nanoscale phenomena, Switches, Biomedicine, Fibroblasts, Metals, Self-assembly
Proceedings Papers

Nanojoule Thermal Transfer in Micromechanical Heterostructures

Rüdiger Berger, Christoph Gerber, James K. Gimzewski, Ernst Meyer, Hans-Joachim Güntherodt
Proc. ASME. IMECE96, Microelectromechanical Systems (MEMS), 49-53, November 17–22, 1996
Paper No: IMECE1996-1335
https://doi.org/10.1115/IMECE1996-1335
View Paper titled, Nanojoule Thermal Transfer in Micromechanical Heterostructures
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Topics: Ethanol, Heat losses, Heat transfer, Heating, Lasers, Nanoscale phenomena, Phase transitions, Silicon nitride ceramics, Thermomechanics, Vacuum
Proceedings Papers

Stochastic Analysis of the Carbon Nanotube Network Interphase in Dry and Pre-Infused Buckypaper

Masoud Yekani Fard, Samuel Perrino, Conor Hedman
Proc. ASME. IMECE2022, Volume 3: Advanced Materials: Design, Processing, Characterization and Applications; Advances in Aerospace Technology, V003T03A044, October 30–November 3, 2022
Paper No: IMECE2022-95523
https://doi.org/10.1115/IMECE2022-95523
View Paper titled, Stochastic Analysis of the Carbon Nanotube Network Interphase in Dry and Pre-Infused Buckypaper
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Topics: Carbon nanotubes, Polymers, Deformation, Nanoscale phenomena, Atomic force microscopy, Deflection, Fundamental forces (Physics), Materials properties, Microscopy, Nanocomposites
Proceedings Papers

A Domain Specific Language Applied to Phonon Boltzmann Transport for Heat Conduction

Eric Heisler, Siddharth Saurav, Aadesh Deshmukh, Sandip Mazumder, Ponnuswamy Sadayappan, Hari Sundar
Proc. ASME. IMECE2022, Volume 8: Fluids Engineering; Heat Transfer and Thermal Engineering, V008T11A012, October 30–November 3, 2022
Paper No: IMECE2022-95034
https://doi.org/10.1115/IMECE2022-95034
View Paper titled, A Domain Specific Language Applied to Phonon Boltzmann Transport for Heat Conduction
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Topics: Heat conduction, Phonons, Complex systems, Computer software, Heat transfer, Nanoscale phenomena, Numerical analysis, Optimization, Physics, Semiconductor devices
Proceedings Papers

Nanoscale Thermometry Using Scanning Joule Expansion Microscopy

Arun Majumdar, John Varesi
Proc. ASME. IMECE97, Microelectromechanical Systems (MEMS), 171-179, November 16–21, 1997
Paper No: IMECE1997-0955
https://doi.org/10.1115/IMECE1997-0955
View Paper titled, Nanoscale Thermometry Using Scanning Joule Expansion Microscopy
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Topics: Joules, Microscopy, Nanoscale phenomena, Temperature measurement, Atomic force microscopy, Imaging, Metals, Resolution (Optics), Signals, Temperature distribution
Proceedings Papers

Resolving Deformation Field Near Corners and Interfaces by Phase Shifting Moiré Interferometry

Daqing Zou, Xiaoyuan He, Sheng Liu, Yifan Guo, Fulong Dai
Proc. ASME. IMECE97, Applications of Experimental Mechanics to Electronic Packaging, 69-76, November 16–21, 1997
Paper No: IMECE1997-1229
https://doi.org/10.1115/IMECE1997-1229
View Paper titled, Resolving Deformation Field Near Corners and Interfaces by Phase Shifting Moiré Interferometry
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Topics: Corners (Structural elements), Deformation, Interferometry, Computer software, Electronic packaging, Failure, Flip-chip, Flip-chip packages, Image processing, Nanoscale phenomena
Proceedings Papers

Tribology on the Macro- to Nanoscales of MEMS Materials: A Review

Bharat Bhushan
Proc. ASME. IMECE98, Micro-Electro-Mechanical Systems (MEMS), 265-266, November 15–20, 1998
Paper No: IMECE1998-1252
https://doi.org/10.1115/IMECE1998-1252
View Paper titled, Tribology on the Macro- to Nanoscales of MEMS Materials: A Review
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Topics: Microelectromechanical systems, Tribology, Friction, Silicon, Polysilicon, Microscale devices, Crystals, Wear, Boundary lubrication, Nanoindentation
Proceedings Papers

Stochastic Analysis of the Interphase Thickness and Modulus in Carbon Fiber Reinforced Polymer Matrix Composites

Masoud Yekani Fard, Brian Raji
Proc. ASME. IMECE2021, Volume 12: Mechanics of Solids, Structures, and Fluids; Micro- and Nano- Systems Engineering and Packaging, V012T12A046, November 1–5, 2021
Paper No: IMECE2021-70600
https://doi.org/10.1115/IMECE2021-70600
View Paper titled, Stochastic Analysis of the Interphase Thickness and Modulus in Carbon Fiber Reinforced Polymer Matrix Composites
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Topics: Atomic force microscopy, Carbon reinforced plastics, Composite materials, Heat, Deformation, Polymer composites, Adhesion, Calibration, Deflection, Elastic constants
Proceedings Papers

Graphene Oxide / Nanodiamond Nanocomposites Characterized via Particle Dispersion and Micro- and Nanoscale Mechanical Properties

Mustafa Abdelrahman, Slade C. Jewell, Abdalla Elbella, Shannon J. Timpe
Proc. ASME. IMECE2021, Volume 3: Advanced Materials: Design, Processing, Characterization, and Applications, V003T03A058, November 1–5, 2021
Paper No: IMECE2021-72137
https://doi.org/10.1115/IMECE2021-72137
View Paper titled, Graphene Oxide / Nanodiamond Nanocomposites Characterized via Particle Dispersion and Micro- and Nanoscale Mechanical Properties
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Topics: Graphene, Mechanical properties, Nanocomposites, Nanoscale phenomena, Particulate matter
Proceedings Papers

Thermal Design and Batch Fabrication of Cantilever Probes for Scanning Thermal Microscopy

Li Shi, Ohmyoung Kwon, Guanghua Wu, Arunava Majumdar
Proc. ASME. IMECE99, Micro-Electro-Mechanical Systems (MEMS), 93-99, November 14–19, 1999
Paper No: IMECE1999-0251
https://doi.org/10.1115/IMECE1999-0251
View Paper titled, Thermal Design and Batch Fabrication of Cantilever Probes for Scanning Thermal Microscopy
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Topics: Cantilevers, Design, Manufacturing, Microscopy, Probes, Semiconductor wafers, Heat transfer, Imaging, Junctions, Lasers
Proceedings Papers

Heat and Charge Conductivities in Superlattices: Two-Scale Measuring and Modeling

V. S. Travkin, I. Catton
Proc. ASME. IMECE2001, Heat Transfer: Volume 4 — Combustion and Energy Systems, 191-202, November 11–16, 2001
Paper No: IMECE2001/HTD-24260
https://doi.org/10.1115/IMECE2001/HTD-24260
View Paper titled, Heat and Charge Conductivities in Superlattices: Two-Scale Measuring and Modeling
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Topics: Heat, Modeling, Superlattices, Microscale devices, Accounting, Electrical conductivity, Electrons, Nanoscale phenomena, Phonons, Physics
Proceedings Papers

Nanolithography With a NSOM Tip: Part I — Numerical Simulations

Nicholas Fang, Xiang Zhang, Min Xi
Proc. ASME. IMECE2001, Heat Transfer: Volume 6 — Heat Transfer in Materials Processing, 201-208, November 11–16, 2001
Paper No: IMECE2001/HTD-24351
https://doi.org/10.1115/IMECE2001/HTD-24351
View Paper titled, Nanolithography With a NSOM Tip: Part I — Numerical Simulations
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Topics: Computer simulation, Nanolithography, Near-field scanning optical microscopy, Hardening (Curing), Photolithography, Polymerization, Engineering simulation, Maxwell equations, Metals, Nanofabrication
Proceedings Papers

Nanoscale Thermal Imaging of Thermionic Devices Using Scanning Thermal Microscopy

Kwong-Luck Tan, Andrew Miner, Xiaofeng Fan, Chris LaBounty, Gehong Zheng, John E. Bowers, Edward T. Croke, Ali Shakouri, Arun Majumdar
Proc. ASME. IMECE2001, Heat Transfer: Volume 7 — Heat Transfer in Electronic Equipment, Student Research, and Visualization Techniques, 193-197, November 11–16, 2001
Paper No: IMECE2001/HTD-24393
https://doi.org/10.1115/IMECE2001/HTD-24393
View Paper titled, Nanoscale Thermal Imaging of Thermionic Devices Using Scanning Thermal Microscopy
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Topics: Imaging, Microscopy, Nanoscale phenomena, Coolers, Cooling, Superlattices, Temperature, Thermocouples, Microelectronic devices, Optoelectronic devices
Proceedings Papers

A Novel MEMS-Based Technique for In-Situ Characterization of Freestanding Nanometer Scale Thin Films Inside SEM and TEM

M. A. Haque, M. T. A. Saif
Proc. ASME. IMECE2001, Micro-Electro-Mechanical Systems (MEMS), 15-20, November 11–16, 2001
Paper No: IMECE2001/MEMS-23802
https://doi.org/10.1115/IMECE2001/MEMS-23802
View Paper titled, A Novel MEMS-Based Technique for In-Situ Characterization of Freestanding Nanometer Scale Thin Films Inside SEM and TEM
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Topics: Microelectromechanical systems, Nanoscale phenomena, Thin films, Tensile testing, Aluminum, Displacement, Force sensors, Stress, Testing
Proceedings Papers

Multiplexed Detection of Nanoscale Microcantilever Deflections for High-Throughput Biomolecular Analysis

Chris Dames, Guanghua Wu, Henry Lin, Aran Majumdar
Proc. ASME. IMECE2001, Micro-Electro-Mechanical Systems (MEMS), 123-130, November 11–16, 2001
Paper No: IMECE2001/MEMS-23818
https://doi.org/10.1115/IMECE2001/MEMS-23818
View Paper titled, Multiplexed Detection of Nanoscale Microcantilever Deflections for High-Throughput Biomolecular Analysis
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Topics: Deflection, Microcantilevers, Microelectromechanical systems, Nanoscale phenomena, Stress
Proceedings Papers

Two-Dimensional Nanoscale Heat Conduction Using Ballistic-Diffusive Equations

Ronggui Yang, Gang Chen
Proc. ASME. IMECE2001, Heat Transfer: Volume 1 — Fundamentals of Heat Transfer, 363-366, November 11–16, 2001
Paper No: IMECE2001/HTD-24141
https://doi.org/10.1115/IMECE2001/HTD-24141
View Paper titled, Two-Dimensional Nanoscale Heat Conduction Using Ballistic-Diffusive Equations
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Topics: Heat conduction, Nanoscale phenomena, Relaxation (Physics), Approximation, Electromagnetic scattering, Heat, Phonons, Radiation scattering, Scattering (Physics), Size effect
Proceedings Papers

Intermolecular and Surface Forces and Their Role in Nanoscale Liquid Transport and Phase Change

Jian-Gang Weng, Chang-Lin Tien, Arun Majumdar
Proc. ASME. IMECE2001, Heat Transfer: Volume 3 — Fluid-Physics and Heat Transfer for Macro- and Micro-Scale Gas-Liquid and Phase-Change Flows, 21-29, November 11–16, 2001
Paper No: IMECE2001/HTD-24196
https://doi.org/10.1115/IMECE2001/HTD-24196
View Paper titled, Intermolecular and Surface Forces and Their Role in Nanoscale Liquid Transport and Phase Change
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Topics: Nanoscale phenomena, Surface tension, Boiling, Bubbles, Condensation, Drops, Liquid films, Molecular dynamics, Nucleation (Physics), Simulation
Proceedings Papers

Investigation of Nanomechanical Properties of the Interphase in a Fiber Reinforced Plastic Composite

Sanjeev K. Khanna, Robb M. Winter, P. Ranganathan, S. B. Yedla, K. Paruchuri
Proc. ASME. IMECE2001, Recent Advances in Solids and Structures, 113-125, November 11–16, 2001
Paper No: IMECE2001/PVP-25214
https://doi.org/10.1115/IMECE2001/PVP-25214
View Paper titled, Investigation of Nanomechanical Properties of the Interphase in a Fiber Reinforced Plastic Composite
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Topics: Composite materials, Fiber reinforced plastics, Elastic moduli, Fibers, Atomic force microscopy, Design, Glass fibers, Glass reinforced plastics, Instrumentation, Mechanical properties
Proceedings Papers

Nanoscale Thermal, Electrical, and Thermoelectric Measurements Using Batch-Fabricated Scanning Probes

Andrew C. Miner, Deyu Li, Kwong-Luck Tan, Li Shi, Arun Majumdar
Proc. ASME. IMECE2001, Heat Transfer: Volume 1 — Fundamentals of Heat Transfer, 355-358, November 11–16, 2001
Paper No: IMECE2001/HTD-24139
https://doi.org/10.1115/IMECE2001/HTD-24139
View Paper titled, Nanoscale Thermal, Electrical, and Thermoelectric Measurements Using Batch-Fabricated Scanning Probes
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Topics: Nanoscale phenomena, Probes, Atomic force microscopy, Lasers, Errors, Sensors, Temperature, Carbon nanotubes, Coolers, Microfabrication
Proceedings Papers

Noncontact Physical Removal of Nano-Scale Particles From Surfaces

Ahmed A. Busnaina, Hong Lin
Proc. ASME. IMECE2001, Micro-Electro-Mechanical Systems (MEMS), 827-830, November 11–16, 2001
Paper No: IMECE2001/MEMS-23918
https://doi.org/10.1115/IMECE2001/MEMS-23918
View Paper titled, Noncontact Physical Removal of Nano-Scale Particles From Surfaces
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Topics: Acoustics, Microelectromechanical systems, Nanoscale phenomena, Particulate matter, Fluctuations (Physics), Integrated circuit fabrication, Nanoparticles, Pressure, Semiconductor wafers, Semiconductors (Materials)