1-1 of 1
Keywords: semiconductor device testing
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2007, 74(5): 996–1005.
Published Online: January 31, 2007
... microactuators cracks compressive strength buckling eddy currents failure analysis semiconductor device testing Obtained from Ref. 4 , Fig. 1 is a scanning electron micrograph of a typical electrothermal actuator, while a line drawing of the same device (absent the guide and the gauge) is contained...