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Keywords: intellectual property
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. March 2025, 25(3): 031006.
Paper No: JCISE-23-1270
Published Online: January 29, 2025
... adoption of metal-based AM technologies. The aggregated data can be used to develop a process-defect model that is more precise, reliable, and adaptable. However, the AM process data often contains printing path trajectory information that can significantly jeopardize intellectual property (IP) protection...
