A new thin-film evaporation model is presented that captures the unsimplified dispersion force along with an electronic disjoining pressure component that is unique to liquid metals. The resulting nonlinear fourth-order ordinary differential equation (ODE) is solved using implicit orthogonal collocation along with the Levenberg–Marquardt method. The electronic component of the disjoining pressure should be considered when modeling liquid metal extended meniscus evaporation for a wide range of work function boundary values, which represent physical properties of different liquid metals. For liquid sodium, as an example test material, variation in the work function produces order-of-magnitude differences in the film thickness and evaporation profile.
Modeling Alkaline Liquid Metal (Na) Evaporating Thin Films Using Both Retarded Dispersion and Electronic Force Components
Tipton, J. B., Jr., Kihm, K. D., and Pratt, D. M. (October 15, 2009). "Modeling Alkaline Liquid Metal (Na) Evaporating Thin Films Using Both Retarded Dispersion and Electronic Force Components." ASME. J. Heat Transfer. December 2009; 131(12): 121015. https://doi.org/10.1115/1.4000022
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