An annulus-shaped nanostructure having a three-layer structure consisting of an annulus aluminum pattern, Al2O3 spacer layer, and Al substrate is presented. High absorption peaks can be easily obtained between 2.5 μm and 12.5 μm in the case of a uniform plane wave at normal incidence. A unilateral annulus structure is designed to obtain an absorption peak of almost 100% by optimal geometry parameters. Moreover, a double annulus consisting of two unilateral annuli is proposed to compare their performances. The results indicate that the double annulus inherit the single one's absorption characteristics, and that the outer loop coupling with the inner one enhances the absorption peak of the inner loop. This structure provides a great potential for application in designing selective thermal emitters, biosensing, etc.
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Infrared Absorption Characteristics Analysis for Annulus Nanostructure of Aluminum Substrate
Qing Hui Pan,
Qing Hui Pan
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
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Xiang Chen,
Xiang Chen
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
Search for other works by this author on:
Sheng Duo Xu,
Sheng Duo Xu
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
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Yong Shuai,
Yong Shuai
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
e-mail: shuaiyong@hit.edu.cn
Harbin Institute of Technology,
Harbin 150001, China
e-mail: shuaiyong@hit.edu.cn
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He Ping Tan
He Ping Tan
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
Search for other works by this author on:
Qing Hui Pan
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
Xiang Chen
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
Sheng Duo Xu
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
Yong Shuai
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
e-mail: shuaiyong@hit.edu.cn
Harbin Institute of Technology,
Harbin 150001, China
e-mail: shuaiyong@hit.edu.cn
He Ping Tan
School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, China
Harbin Institute of Technology,
Harbin 150001, China
1Corresponding author.
Presented at the 2016 ASME 5th Micro/Nanoscale Heat & Mass Transfer International Conference. Paper No. MNHMT2016-6551.
Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received May 31, 2016; final manuscript received November 3, 2016; published online February 14, 2017. Assoc. Editor: Zhuomin Zhang.
J. Heat Transfer. May 2017, 139(5): 054502 (4 pages)
Published Online: February 14, 2017
Article history
Received:
May 31, 2016
Revised:
November 3, 2016
Citation
Hui Pan, Q., Chen, X., Duo Xu, S., Shuai, Y., and Ping Tan, H. (February 14, 2017). "Infrared Absorption Characteristics Analysis for Annulus Nanostructure of Aluminum Substrate." ASME. J. Heat Transfer. May 2017; 139(5): 054502. https://doi.org/10.1115/1.4035250
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