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L. Cha˜tellier
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Proceedings Papers

A Help for Lifetime Management: Defect Characterisation Through Signal Processing of Ultrasonic Data

S. Gautier, L. Cha˜tellier
Proc. ASME. PVP2003, Aging Management and Component Analysis, 107-112, July 20–24, 2003
Paper No: PVP2003-2159
DOI: https://doi.org/10.1115/PVP2003-2159
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Topics: Signal processing, Echoes, Inspection, Nondestructive evaluation, Corners (Structural elements), Degrees of freedom, Diffraction, Flight, In-service inspection, Optical mirrors