Spectroscopic ellipsometry has been successfully used to characterize the CdS/CdTe heterojunction solar cell deposited on TEC15 glass. The effects of copper treatment on the optical properties of a cadmium chloride treated photovoltaic device were investigated using ellipsometry. No changes in either the band gaps or critical points of CdTe layer were noticed as a result of copper treatment. The copper treated CdTe layer exhibited a higher refractive index in the visible and longer wavelengths , as compared with the untreated layer. This was attributed to the increased disorder in the case of copper treated layer.
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