Fig. 5
![(a) Bending test. An NW clamped on a nanomanipulator probe is bent in an MEMS device. (Reprinted with permission from Cheng et al. [101]. Copyright 2015 by Nature Publishing Group.) (b) Buckling test. An NW is compressed to buckling between a nanomanipulator probe (actuator) and an AFM cantilever (load sensor) (from Ref. [53]). (c) Tension test. An NW is pulled between a nanomanipulator probe (actuator) and an AFM cantilever (load sensor). (Reprinted with permission from Zhu et al. [51]. Copyright 2009 by American Chemical Society.) (d) Resonance test. An NW clamped on a nanomanipulator probe is excited to resonance by mechanical vibration. (Reproduced with permission from Qin et al. [61]. Copyright 2012 by Wiley).](https://asmedc.silverchair-cdn.com/asmedc/content_public/journal/appliedmechanicsreviews/69/1/10.1115_1.4035511/10/amr_069_01_010802_f005.png?Expires=1716651296&Signature=maFV4vJ4TffMnCeW0Y1OvNt7l08zdDO6lQqvNucbtdhHM-Pqi8-7GzhpL4zbhOPELdlL6jIORILK4ckHn825WBzerqfiBbYkxzgMNytEdyc3d7oaKmJHLdP-TwUi2JdcTPLpc1~ViDZwGcjiHEictMUmFGTt2WL~MQf1iFWpLsfC9QRK1KMy6gTZ7KxB9c54KM3-ZiuzYHufrj6k8tRRGs9bTHW8NFn1BieeCOXk~NYfFQHqAC3KP74J6TEtGcDVxOdd~YtZY9D1v9eoFXzsPluJGAJ06y1J5CAJF-TS64SmF-LOtHdevLgjhhiuYGG4jEbljlxksz3QD1~vrGAShg__&Key-Pair-Id=APKAIE5G5CRDK6RD3PGA)
(a) Bending test. An NW clamped on a nanomanipulator probe is bent in an MEMS device. (Reprinted with permission from Cheng et al. [101]. Copyright 2015 by Nature Publishing Group.) (b) Buckling test. An NW is compressed to buckling between a nanomanipulator probe (actuator) and an AFM cantilever (load sensor) (from Ref. [53]). (c) Tension test. An NW is pulled between a nanomanipulator probe (actuator) and an AFM cantilever (load sensor). (Reprinted with permission from Zhu et al. [51]. Copyright 2009 by American Chemical Society.) (d) Resonance test. An NW clamped on a nanomanipulator probe is excited to resonance by mechanical vibration. (Reproduced with permission from Qin et al. [61]. Copyright 2012 by Wiley).
